GE Inspection USM35X Rightrax DL2 Ultrasonic Flaw Detector

Description

GE Inspection USM35X Rightrax DL2 Ultrasonic Flaw Detector is required to exchange data and settings between the instrument USM 35X and the software AMPLECTOR Instrument Manager. All versions are supported USM 35X, USM 35X DAC, USM 35X S, USM 35X SD and instrument options (DAC/TCG, DGS, Data Logger with 3rd gate).

Instrument data supported by the Instrument driver USM 35X: Instrument settings (ultrasonic parameters), A-scans, test results, and Data Recorder file types “Linear” and “Grid”.

GE Inspection USM35X Rightrax DL2 Ultrasonic Flaw Detector Features:

• Straightforward display (as in Windows Explorer) of dataset files of the USM 35X in the AMPLECTOR Instrument Manager with detailed display of the most important instrument settings (ultrasonic parameters), A-scan and measurement values with extended information parameters
• Straightforward display of Data Recorder files (as in Windows Explorer) with detailed display of Data Recorder type, statistics, as well as instrument settings and notes
• Display of instrument information (for example software version)
• Import and export of dataset files
• The thickness alarm values (lower and upper threshold of the material thickness) can be subsequently set and changed in the AMPLECTOR Instrument Manager

GE Inspection USM35X Rightrax DL2 Ultrasonic Flaw Detector Included:

• USM35X-DACFlaw Detector
• Battery Charger
• Operating Manual
• Carry Case

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Specifications:

• Calibration ranges
• Min: 0 to 0.5 mm +10 % (steel), 0 to 0.02” +10 % (steel)
• Max: 0 to 9,999 mm +10 % (steel), 0 to 390” +10 % (steel) within the frequency range from 0.2 to 1 MHz / 0.5 to 4 MHz 0 to 1,420 mm +10% (steel),0 to 56” +10 % (steel) within the frequency range from 0.8 to 8 MHz / 2 to 20 MHz
• Sound velocity: 1,000 to 15,000 m/s, 40 to 600 inch/ms variable in steps of 1 m/s, 0.1 inch/ms and fixed programmed values
• Display delay: From -10 to 1,000 mm, -0.3 to 40” (340 µs)
• Probe delay: 0 to 200 µs
• Auto calibration: Measurement and setting of sound velocity and probe delay using two known calibration echoes (2-point calibration)
• Pulse intensity: 220 pF, 1 nF
• Damping: 50 ohms, 500 ohms (1,000 ohms in TR mode)
• Pulse repetition frequency: 4 to 1,000 Hz, variable in 10 steps
  Frequency ranges (-3 dB): 0.2 to 1 MHz / 0.5 to 4 MHz / 0.8 to 8 MHz / 2 to 20 MHz
• Gian: 0 to 110 dB, variable in steps
• Gain steps: 0.5 / 1 / 2 / 6 / 12 dB (or user-adjustable), step 0 is locked
• Fine gain: 4 dB, continuously variable in 40 steps
• Rectification: Full-wave, negative and positive half-wave, RF mode
• Reject: Linear, 0 to 80 % screen height Variable in steps of 1 %
• Monitor gates: 2 independent gates in color bar mode, start and width variable over the entire calibration range, response threshold of 10 to 90 % screen height variable in steps of 1 % (coincidence and anti-coincidence), alarm signal via LED and connectable internal horn, Gate A switchable as interface gate for Gate B, gate magnifier (zooming of gate range over the entire display range)
• Sound path measurement: Digital display of sound path (projection distance, depth) between initial pulse and the first echo in the gate, or between the echoes in the two gates, measurement always at the intersection point with the echo flank or echo peak
• Measurement resolution: 0.01 mm within a range up to 99.99 mm/ 0.1 mm within a range from 100 to 999.9 mm/ 1 mm above 1,000 mm, 0.001” within a range up to 9.999”/ 0.01” above 10” With evaluation in the frozen A-scan: 0.5 % of the calibration range setting
• Amplitude display: In % screen height
• USM 35X DAC: additionally in dB above DAC or TCG
• USM 35X S: additionally in dB above DGS curve or ERS
• Displayed reading: Sound path, (reduced) projection distance, depth, amplitude for every gate, userconfigurable at four positions of measurement line and of the zoomed display in the A-scan
• A-scan functions: Manual or automatic A-scan freeze, A-scan comparison, echo dynamics (envelope), peak echo storage
• Color functions: Patented color-coded display of legs in angle testing, adaptation of background color to the light conditions of test environment, color display of monitor gates and of registration curves (DAC, TCG, DGS) for direct recognition, messages and alarms in red characters
• DAC/TCG (Option) Only USM 35X DAC and USM 35X S: Distance- Amplitude Curves (DAC) or TCG line (TCG) with a maximum of 10 reference echoes, 4 other curves or lines can be displayed with variable dB intervals. JIS DAC can be selected in order to allow inspection acording to JIS Z3060-2002 (Japanese Inspection Standard). Automatic gain control during DAC recording.
  DGS (Option) Only USM 35X S: DGS curves for single-element and dual-element probes (B1S, B2S, B4S, MB2S, MB4S, MB5S, WB…-1, WB…-2, SWB…-2, SWB…-5, MWB…-2, MWB…-4, SEB and MSEB) and for all materials, sound attenuation and transfer loss correction, 4 other curves can be displayed with variable dB intervals
• Display size/ resolution: 116 mm x 87 mm, 4.6″ x 3.4″ (W x H) ; 320 x 240 pixels
• A-scan size/ resolution: 116 mm x 80 mm, 4.6” x 3.2” ; 320 x 220 pixels (zoom)
• Units of measurement: mm,inch
• Data memory: 800 instrument setups or reports, including AScans can be stored, recalled, printed or exported to a computer.
• Direct documentation: Display screen contents, report including A-scan, reading, function list (parameter dump)
• Printer Driver: HP DeskJet, HP LaserJet, HP DJ 1200 (DeskJet),HP LJ 1012 (LaserJet), EPSON FX/LX, SEIKO DPU
• RS 232 interface: 9-pin DSUB, bi-directional, 300 – 57,600 baud An USB adapator cable can be provided to connect the USM 35X to a computer that does not have RS 232 port
• Input/Output: 8-way Lemo-1 socket (trigger output, gate alarm, test data release)