Bruker S1 Turbo SD-LE Handheld XRF Analyzer

Description

Bruker S1 Turbo SD-LE Handheld XRF Analyzer such an important innovation in this field? The key is the XFlash® Silicon Drift Detector, which offers count rates and resolution far superior to traditional SiPIN detector technology. This results in even faster analysis – 2-3 second grade ID’s and 5 seconds for elemental chemical analysis (excluding light elements).

Bruker S1 Turbo SD-LE Handheld XRF Analyzer Features:

Supports many calibrations and applications, including PMI, Scrap metal sorting and Mining & Exploration
• The first ever SDD-based handheld analyzer
• Superior count rates and resolution (compared to previous generation SiPin instruments)
• Five times faster than previous generations
• Lower detection limits
• Grade library includes low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
• Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBO SD LE only)

Included:

• S1 Turbo SD-LE Handheld XRF Analyzer with Accessories

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Specifications: